@Article{ Malagon_Bota_Torrens_Gili_Praena_FERNANDEZ_MACÍAS_Quesada-Molina_SANCHEZ_Jimenez-Ramos_Garcia-Lopez:38-45,

author = { D. Malagon and S. Bota and G. Torrens and X. Gili and Javier Praena Rodríguez and B. FERNANDEZ and M. MACÍAS and Jose Manuel Quesada-Molina and C. SANCHEZ and Maria Del Carmen Jimenez-Ramos and Francisco Javier Garcia-Lopez } ,

title = { Soft error rate comparison of 6T and 8T SRAM ICs using mono-energetic proton and neutron irradiation sources },

journal = { Microelectronics Reliability },

year = { 2017 },

volume = { 78 },

pages = { 38-45 },

}